daveteauk, I used predictive design approach of aging impact in my circuits, here is some info to read about it:
https://ntrs.nasa.gov/api/citations/20110014343/downloads/20110014343.pdf
https://en.wikipedia.org/wiki/Transistor_aging
Overview of Aging Effects on MOSFET Devices
- MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) experience aging, which leads to performance degradation and eventual failure. This aging process is influenced by several factors.
Main Causes of Aging
- Electromigration
- Definition: Movement of ions due to electron flow.
- Impact: Causes material degradation, leading to intermittent glitches and failures.
- Charge Trapping
- Definition: Trapping of charge carriers in the dielectric material.
- Impact: Affects the electrical characteristics of the MOSFET, reducing its efficiency.
Consequences of Aging
- Performance Degradation: As MOSFETs age, their ability to switch and conduct diminishes.
- Reliability Issues: Increased likelihood of failure in critical applications, such as aerospace and electronics.
- Underclocking: Manufacturers often run chips at lower speeds to mitigate aging effects and enhance reliability.
Predictive Approaches
- Data-Driven Methodologies: Techniques are being developed to predict the remaining useful life of aging MOSFETs.
- Thermal Stress Testing: Controlled experiments help understand how thermal conditions accelerate aging.
Understanding these aging effects is crucial for improving the design and reliability of MOSFET devices in various applications.

